Features of SALD-7500nano

Features of SALD-7500nano

Single detection face continuously captures forward- scattered light up to a 60° angle

The target particle size range is seamlessly covered using a single measurement principle, single optical system, and single light source. Additionally, because the SALD-7500nano does not incorporate multiple optical systems that create discontinuities in the data, accurate particle size distribution measurements are possible across the entire measurement range using a single standard. The application of the SLIT* optical system, based on sophisticated scattered light intensity tracing technology, smashes conventional wisdom to continuously capture forward-scattered light at up to a wide 60° angle on a single detector face. This achieves high resolution in the fine particle region.

* SLIT (Scattered Light Intensity Trace)

High-Resolution / High-Sensitivity Wing Sensor ll

High-Resolution/High-Sensitivity Wing Sensor ll Forward diffracted/scattered light is detected by a “wing sensor ll”, a 76-element sensor developed using semiconductor manufacturing technology of the highest level. This sensor can detect greatly fluctuating small-angle forward scattering light with a high level of resolution and wide-angle scattering light of a low optical intensity with a high level of sensitivity. Also, side scattered light is detected by one sensor element and back scattered light is detected by four sensor elements. Accurately capturing light intensity distribution patterns with a total of 81 sensor elements enables the high-resolution, high-precision measurement of particle size distributions over a wide particle diameter range.

More Stable Optical System

The Omnidirectional Shock Absorption Frame (OSAF) fully isolates all elements of the optical system from shocks and vibrations. This eliminates concerns about adjusting the optical axis.

Built-in Self-Diagnostic Functions Ensure Easy Maintenance

These analyzers incorporate powerful self-diagnostic functions. The output signals sent by the sensors and detecting elements and the instrument operating status can be checked, facilitating easier maintenance. Using the Operation Log function, detailed information about, for example, the instrument usage status and contamination of the cells is included with all the measurement data, making it is possible to investigate the validity of measurement data obtained in the past.

Laser diffraction method ISO 13320 and JIS Z 8825-1 compliant

Tke SALD-7500nano complies with ISO 13320 and JIS Z 8825-1 laser diffraction and scattering standards.

Validation possible with JIS standard particles

System performances can be confirmed using a MBP1-10 standard particle specified in JIS Z8900-1. These samples have a broad particle size distribution, which is specified by the JIS standard. Using these samples allows verifying that the instrument is always accurate.

Allows verifying the validity of measurement results by referencing light intensity distribution data

Since light intensity distribution data (raw data) and measurement results (particle size distribution data) can be displayed on the same screen, measurement results can be verified while viewing both data sets. This allows users to verify whether the detection signal level (particle concentration) is appropriate, and to confirm the validity of measurement results from multiple aspects, such as in terms of the distribution width and the presence of aggregates and contaminants.

Wide application applicability

The system configuration can be optimized to address various uses, purposes, measurement objects, environments and conditions.

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